Research

I am currently a part of the Radiation Effects and Reliability group at Vanderbilt University. This group researches the impact of radiation induced errors on microelectronic circuits and tests methods for prevention. My research thus far has been focused on the prevention of single event upsets by correcting or overriding at the architectual level.

My advisor is Dr. William H. Robinson. His website can be found here.

Research Interests

• Computer Architecture
• Reliability of microelectronics
• Multi-core Processors
• Embedded Systems

Projects

• Self-checking ALU with Berger Codes
• Radiation Hardening By Architecture of Multicore Systems
• Reliability characterization of library cells in EDA

Publications

[1] Daniel Limbrick, William H. Robinson, Bharat L. Bhuva, "Reliability-Aware Synthesis: XOR logic function case study," IEEE Workshop on Silicon Errors in Logic - System Effects, March 2010

[2] Daniel Limbrick, Edward Ossi, Corey Toomey, Bharat Bhuva, William Robinson, "Characterization of Control Bit Errors in the MIPS R2000 Microprocessor," Government Microcircuit Applications and Critical Technology Conference (GOMACTech), March 2010

[3] Daniel Limbrick, "Embedding Temporal Signatures to Monitor Microarchitectural Control Flow," Master's Thesis, Vanderbilt University, December 2009

[4] Edward J. Ossi, Daniel Limbrick, William H. Robinson, Bharat L. Bhuva, "Soft-error Mitigation at the Architecture-Level Using Berger Codes and Instruction Repetition," IEEE Workshop on Silicon Errors in Logic - System Effects, March 2009